This study analyzed the results of the National Center Test regarding the ratio to the sum scores of the five subject areas among successful public university candidates. The candidates’ success ratio to the sum scores did not increase for the upper middle achievers (the plateau effect of passing ratios), while ratios for other levels of academic abilities constantly raised with the sum scores. In order to examine this trend closer, the candidates were divided into three sub-groups by the levels of the colleges which the candidates actually applied. When the analysis was conducted within these three sub-groups, the plateau effect disappeared; the success ratio increased as the sum scores raised. It means that the candidates’ self-assessment affects their own decision-making on college application, which causes the competition ratio to be even across colleges. This phenomenon may be acting as a social system to equally distribute the candidates among universities.
"},{"@language":"ja","@value":"センター試験を受験して 国公立大学に出願した高校新卒者について，5 教科の合計得点に対する大学の合格率を分析した。その結果，得点率が中上位の層では，得点が高くなっても合格率が上がらない，という「合格率の停滞現象」が見出された。その原因の検討のため，大学の学部ごとに合格者の成績から難易度を算出し，各募集単位を高・中・低の3 つのグループに分割した。このグループ別の分析では合格率の停滞は見られず，得点が高くなると合格率は滑らかに上昇していた。ここで合格率の逆数は競争倍率なので，合格率が停滞している範囲では，「競走倍率の平準化」がなされていることになる。大学出願時には，センター試験の自己採点の結果 と，大学・学部の難易度を照らし合わせることで，出願先がシフトする。それによって，競争倍率の平準化が促進される。したがって，受験者の私的な自己採点結果の利用は，マクロに捉えた場合には，受験者を分散配置する社会的なフィルタとしても機能している可能性がある 。
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Teruhisa"},{"@language":"ja","@value":"内田 照久"}],"jpcoar:affiliationName":[{"@language":"ja","@value":"独立行政法人 大学入試センター"},{"@language":"en","@value":"the National Center for University Entrance Examinations"}]},{"@id":"https://cir.nii.ac.jp/crid/1410845712999050752","@type":"Researcher","personIdentifier":[{"@type":"NRID","@value":"9000398134102"}],"foaf:name":[{"@language":"en","@value":"SUZUKI Norio"},{"@language":"ja","@value":"鈴木 規夫"}],"jpcoar:affiliationName":[{"@language":"ja","@value":"独立行政法人 大学入試センター"},{"@language":"en","@value":"the National Center for University Entrance Examinations"}]},{"@id":"https://cir.nii.ac.jp/crid/1420282801213447424","@type":"Researcher","personIdentifier":[{"@type":"KAKEN_RESEARCHERS","@value":"90133610"},{"@type":"NRID","@value":"1000090133610"},{"@type":"NRID","@value":"9000002518900"},{"@type":"NRID","@value":"9000363977530"},{"@type":"NRID","@value":"9000363971411"},{"@type":"NRID","@value":"9000363968943"},{"@type":"NRID","@value":"9000004341081"},{"@type":"NRID","@value":"9000363998938"},{"@type":"NRID","@value":"9000363977236"},{"@type":"NRID","@value":"9000017546473"},{"@type":"NRID","@value":"9000003229526"},{"@type":"NRID","@value":"9000364041015"},{"@type":"NRID","@value":"9000004363351"},{"@type":"NRID","@value":"9000363977595"},{"@type":"NRID","@value":"9000004917372"},{"@type":"NRID","@value":"9000363989546"},{"@type":"NRID","@value":"9000002397543"},{"@type":"NRID","@value":"9000363969830"},{"@type":"NRID","@value":"9000364039827"},{"@type":"NRID","@value":"9000006953665"},{"@type":"NRID","@value":"9000016829110"},{"@type":"NRID","@value":"9000003229529"},{"@type":"NRID","@value":"9000363999939"},{"@type":"NRID","@value":"9000403902857"},{"@type":"NRID","@value":"9000011166603"},{"@type":"NRID","@value":"9000363989297"},{"@type":"NRID","@value":"9000363982220"},{"@type":"NRID","@value":"9000017894455"},{"@type":"NRID","@value":"9000364037239"},{"@type":"NRID","@value":"9000002397461"},{"@type":"NRID","@value":"9000364037530"},{"@type":"NRID","@value":"9000363999944"},{"@type":"RESEARCHMAP","@value":"https://researchmap.jp/read0043128"}],"foaf:name":[{"@language":"en","@value":"ARAI Katsuhiro"},{"@language":"ja","@value":"荒井 克弘"}],"jpcoar:affiliationName":[{"@language":"ja","@value":"独立行政法人 大学入試センター"},{"@language":"en","@value":"the National Center for University Entrance Examinations"}]},{"@id":"https://cir.nii.ac.jp/crid/1410845712999050880","@type":"Researcher","personIdentifier":[{"@type":"NRID","@value":"9000005427311"}],"foaf:name":[{"@language":"en","@value":"HASHIMOTO Takamitsu"},{"@language":"ja","@value":"橋本 貴充"}],"jpcoar:affiliationName":[{"@language":"ja","@value":"帝京大学"},{"@language":"en","@value":"Teikyo University"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"18809618"},{"@type":"EISSN","@value":"24337447"},{"@type":"NDL_BIB_ID","@value":"000008097854"},{"@type":"ISSN","@value":"18809618"},{"@type":"LISSN","@value":"18809618"},{"@type":"NCID","@value":"AA12190918"}],"prism:publicationName":[{"@language":"ja","@value":"日本テスト学会誌"},{"@language":"en","@value":"Japanese Journal for Research on 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