A Study of SOI Wafer with SiC-BOX Layer using Room-Temperature Bonding

Bibliographic Information

Other Title
  • 常温接合によるSiC-BOX層SOIウェーハの検討
Published
2019-02-25
DOI
  • 10.11470/jsapmeeting.2019.1.0_1274
Publisher
The Japan Society of Applied Physics

Journal

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