著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
KOMEDA Shin and TSUNODA Masateru and NAKASAI Keitaro and UWANO Hidetake,Prediction of Residual Defects after Code Review Based on Reviewer Confidence,IEICE Transactions on Information and Systems,0916-8532,一般社団法人 電子情報通信学会,2024-03-01,E107.D,3,273-276,https://cir.nii.ac.jp/crid/1390862268821749888,https://doi.org/10.1587/transinf.2023mpl0002