Microscopic stress-strain curves were obtained by applying stress measurements using the HR-EBSD method and strain measurements using the DIC method to the same field of view in SEM in-situ tensile tests. From the analysis of these microscopic stress-strain curves, yield stress map and work hardening rate map were successfully produced. The relationship between these mechanical property value maps and the microstructure is investigated. The yield stress maps confirm the tendency of the local yield stress to show different values for different grains, but the Schmid factor alone cannot explain the magnitude of the yield stress. When adjacent grains with significantly different Schmid factors deformed cooperatively, the yield stress is found to increase as a result of stress partitioning. Localized regions of extreme work hardening rates were observed in the work hardening rate maps. These regions were located close to grain boundaries with low m′ values where slip transfer was difficult and an interruption of the slip bands was observed. In addition, the rate of increase of GND density with strain was large in these regions. From these results, it can be understood that the extreme work hardening rates are due to increased back stresses caused by the accumulation of dislocations on low m′ grain boundaries.
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Japan Inst. Metals"},{"@language":"en","@value":"J. Japan Inst. Metals and Materials"},{"@language":"en","@value":"Journal of the Japan Institute of Metals"},{"@language":"ja","@value":"日本金属学会誌"},{"@language":"en","@value":"J.Japan Inst.Metals"},{"@language":"ja","@value":"日本金屬學會誌"}],"dc:publisher":[{"@language":"en","@value":"The Japan Institute of Metals and Materials"},{"@language":"ja","@value":"公益社団法人 日本金属学会"}],"prism:publicationDate":"2024-09-01","prism:volume":"88","prism:number":"9","prism:startingPage":"216","prism:endingPage":"225"},"reviewed":"false","dcterms:accessRights":"http://purl.org/coar/access_right/c_abf2","url":[{"@id":"https://www.jstage.jst.go.jp/article/jinstmet/88/9/88_J202404/_pdf"}],"availableAt":"2024-09-01","foaf:topic":[{"@id":"https://cir.nii.ac.jp/all?q=digital%20image%20correlation","dc:title":"digital image correlation"},{"@id":"https://cir.nii.ac.jp/all?q=high-resolution%20electron%20backscatter%20diffraction","dc:title":"high-resolution electron backscatter 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