Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Fuke Seiya and Sasaki Takuo and Kawai Yoshikazu and Hibino Hiroki,<i>In-situ</i> XRD analysis of GaN remote epitaxy on graphene grown on <i>c</i>-Al<sub>2</sub>O<sub>3</sub>,JSAP Annual Meetings Extended Abstracts,2436-7613,The Japan Society of Applied Physics,2022-02-25,2022.1,0,2921-2921,https://cir.nii.ac.jp/crid/1390866882742544512,https://doi.org/10.11470/jsapmeeting.2022.1.0_2921