{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1410001205212416640.json","@type":"Researcher","personIdentifier":[{"@type":"NRID","@value":"9000021112447"}],"foaf:Person":[{"foaf:name":[{"@language":"en","@value":"Kim Joonyun"}],"foaf:familyName":[{"@language":"en","@value":"Kim"}],"foaf:givenName":[{"@language":"en","@value":"Joonyun"}]}],"career":[{"institution":{"notation":[{"@language":"en","@value":"Electronics Department, Korea Aerospace Research Institute"}]}}],"product":[{"@id":"https://cir.nii.ac.jp/crid/1390001205212416640","@type":"Article","productIdentifier":[{"@type":"DOI","@value":"10.1587/elex.7.1796"},{"@type":"URI","@value":"http://www.jstage.jst.go.jp/article/elex/7/24/7_24_1796/_pdf"},{"@type":"NAID","@value":"130000401455"}],"notation":[{"@language":"en","@value":"Cell placement of MCM for reliability optimization"}],"relation":[{"type":"creator"}]}],"dataSourceIdentifier":[{"@type":"JALC","@value":"oai:japanlinkcenter.org:0036118394_4HrbJ0RY2EevTNKCuYkxS4liv8m"},{"@type":"CIA","@value":"130000401455_4HrbJ0RY2EevTNKCuYkxS4liv8m"},{"@type":"CROSSREF","@value":"10.1587/elex.7.1796_TUzhDfbpVE1IBv7SG8Ak43lSuvv"}]}