著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Sang-Yun Kim and Kyoung-Rok Han and Byung-Kil Choi,Negative Bias Temperature Instability of Bulk Fin Field Effect Transistor,"Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP",00214922,Tokyo : Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics,2006-03,45,3A,1467-1470,https://cir.nii.ac.jp/crid/1520009407724730880,https://doi.org/10.1143/jjap.45.1467