著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Hiroshi Aozasa and Ichiro Fujiwara and Yoshiaki Kamigaki,"Analysis of carrier traps in silicon nitride film with discharge current transient spectroscopy, photoluminescence, and electron spin resonance","Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP",00214922,Tokyo : Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics,2007-09,46,9A,5762-5766,https://cir.nii.ac.jp/crid/1520009407898710272,https://doi.org/10.1143/jjap.46.5762