Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Wan-Ju Chiang and Da-Yuan Lee and Wen-Tai Lu,Effects of Fluorine Incorporation on the Negative-Bias-Temperature Instability(NBTI) of P-Channel MOSFETs,電子情報通信学会技術研究報告 = IEICE technical report : 信学技報,09135685,東京 : 電子情報通信学会,2002-07-01,102,178,13-16,https://cir.nii.ac.jp/crid/1520009407929700992,