Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Kyeong Min Yu and Jin Tae Yuh and Sang Hee Ko Park,Trap States of the Oxide Thin Film Transistor,Japanese journal of applied physics : JJAP,00214922,Tokyo : The Japan Society of Applied Physics,2013-10,52,10,,https://cir.nii.ac.jp/crid/1520009408576216704,