著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Dong-Yeon Lee and Moo-Yeon Lee and Dae-Gab Gweon,Orthogonality Correction of Planar Sample Scanner for Atomic Force Microscope,"Japanese journal of applied physics. Part 2, Letters & express letters",00214922,Tokyo : Japan Society of Applied Physics,2006-04,45,12-16,L370-372,https://cir.nii.ac.jp/crid/1520010380519568768,