Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Sadao Sakamoto and Tomonao Kobayashi and Shuichi Nonomura,Epidemiological Analysis of Degradation in Silicon Photovoltaic Modules,Japanese journal of applied physics : JJAP,00214922,Tokyo : The Japan Society of Applied Physics,2012-10,51,10,,https://cir.nii.ac.jp/crid/1520290882015848832,