著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Eika Tsunemi and Nobuo Satoh and Yuji Miyato,Multi-probe atomic force microscopy with optical beam deflection method,"Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP",00214922,Tokyo : Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics,2007-08,46,8B,5636-5638,https://cir.nii.ac.jp/crid/1520290882185602304,https://doi.org/10.1143/jjap.46.5636