Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Tetsuya Okuyama and Masaru Nakayama and Yoshitsugu Tomokiyo,Analysis of lattice strains around precipitates in Si by CBED and FEM,電子顕微鏡,04170326,東京 : 日本顕微鏡学会,2001,36,-,276-279,https://cir.nii.ac.jp/crid/1520290882387382912,