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Two-dimensional carrier profiling by kelvin-probe force microscopy
Bibliographic Information
- Other Title
-
- Two dimensional carrier profiling by kelvin probe force microscopy
- Published
- 2008-06
- DOI
-
- 10.1143/jjap.47.4448
- Publisher
- Tokyo : The Japan Society of Applied Physics
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Description
資料形態 : テキストデータ プレーンテキスト
コレクション : 国立国会図書館デジタルコレクション > デジタル化資料 > 雑誌
Journal
-
- Japanese journal of applied physics : JJAP
-
Japanese journal of applied physics : JJAP 47 (6), 4448-4453, 2008-06
Tokyo : The Japan Society of Applied Physics
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Details 詳細情報について
-
- CRID
- 1520290882392801792
-
- NII Article ID
- 40016110958
-
- NII Book ID
- AA12295836
-
- ISSN
- 00214922
- 13474065
-
- NDL BIB ID
- 9544523
-
- Text Lang
- en
-
- NDL Source Classification
-
- ZM35(科学技術--物理学)
-
- Data Source
-
- NDL Search
- Crossref
- CiNii Articles
