Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Yoshihiro Naka and Naokatsu Yamamoto and Masato Kishi,Optical characterization and X-ray photoelectron spectroscopy of erbium-doped silicon suboxide infrared emitting at 1.5μm,Japanese journal of applied physics : JJAP,00214922,Tokyo : The Japan Society of Applied Physics,2008-12,47,12,8871-8873,https://cir.nii.ac.jp/crid/1520290883032208768,