著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Takashi Matsumoto and Hiroaki Makino and Kazutoshi Kobayashi,A 65nm complementary metal-oxide-semiconductor 400ns measurement delay negative-bias-temperature-instability recovery sensor with minimum assist circuit,Japanese journal of applied physics : JJAP,00214922,Tokyo : The Japan Society of Applied Physics,2011-04,50,4,,https://cir.nii.ac.jp/crid/1520290883195273728,