著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
In-Hwan Ji and Byung-Chul Jeon and Young-Hwan Choi,A New 600V Punch Through-Insulated Gate Bipolar Transistor with the Monolithic Fault Protection Circuit Using the Floating p-Well Voltage Detection,"Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP",00214922,Tokyo : Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics,2006-10,45,10A,7587-7591,https://cir.nii.ac.jp/crid/1520290883323831424,https://doi.org/10.1143/jjap.45.7587