著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Swe Zin Linn Htet and Ryo Torihara and Tatsuya Sakoda and Noriyuki Hayashi,Resistive Behavior of Schottky Barrier Diodes and Rectifier Diodes Damaged by Exposure to Standard Lightning Impulse Voltages,"電気学会研究会資料. EPP = The papers of technical meeting, IEE Japan",,東京 : 電気学会,2022-11-22,2022,110-115・117・119-128・130-133,11-16,https://cir.nii.ac.jp/crid/1520294496053820672,