著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Junsoo Bae and Kyuman Hwang and Kwangho Park,Microstructural characterization in reliability measurement of phase change random access memory,Japanese journal of applied physics : JJAP,00214922,Tokyo : The Japan Society of Applied Physics,2011-04,50,4,,https://cir.nii.ac.jp/crid/1520572357205808384,