著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Kazunori Fukuda and Takayoshi Yoshida and Takayoshi Shimura,White X-ray Topography of Lattice Undulation in Bonded Silicon-on-Insulator Wafers,"Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP",00214922,Tokyo : Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics,2006-09,45,9A,6795-6799,https://cir.nii.ac.jp/crid/1520572357696030208,https://doi.org/10.1143/jjap.45.6795