著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Nobuo Satoh and Eika Tsunemi and Yuji Miyato,Multi-probe atomic force microscopy using piezoelectric cantilevers,"Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP",00214922,Tokyo : Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics,2007-08,46,8B,5543-5547,https://cir.nii.ac.jp/crid/1520572357766148352,https://doi.org/10.1143/jjap.46.5543