著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Yoshiyuki Fukumoto and Hideaki Numata and Katsumi Suemitsu,Switching-Field Stabilization against Effects of High-Temperature Annealing in Magnetic Tunnel Junctions using Thermally Reliable NLxFe100-x/Al-Oxide/Ta Free Layer,"Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP",00214922,Tokyo : Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics,2006-05,45,5A,3829-3834,https://cir.nii.ac.jp/crid/1520572357954614912,https://doi.org/10.1143/jjap.45.3829