Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Ihara M,Automatic control of sliver thickness by high-frequency capacitance measuring principle-1-Configuration of the control system and characteristics of the detecting element,静岡大学工学部研究報告,05830915,浜松 : 静岡大学工学部,1966-03,,16,13-25,https://cir.nii.ac.jp/crid/1520572360113625600,