著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Y. Abe and H. Asami and H. Yamauchi,Chemical Structure Changes in TOPO Capped CdSe Nanocrystals Thin Films by Comparable ToF-SIMS and XPS Study,Journal of surface analysis,13411756,東京 : 表面分析研究会,2004-07,11,2,62-70,https://cir.nii.ac.jp/crid/1520573329988168704,