Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Yunxiang Yang and Gang Du and Ruqi Han,Simulation study of intrinsic parameter fluctuations in variable-body-factor silicon-on-thin-box metal oxide semiconductor field effect transistors,Japanese journal of applied physics : JJAP,00214922,Tokyo : The Japan Society of Applied Physics,2011-04,50,4,,https://cir.nii.ac.jp/crid/1520853832457285120,