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Electrical Properties of a Silicon Nanocrystal Embedded in a Thin Oxide Layer
Bibliographic Information
- Other Title
-
- Special Issue: Scanning Tunneling Microscopy/Spectroscopy and Related Techniques
- Special Issue Scanning Tunneling Microscopy Spectroscopy and Related Techniques
- Published
- 2006-03
- DOI
-
- 10.1143/jjap.45.2386
- Publisher
- Tokyo : Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics
Search this article
Description
資料形態 : テキストデータ プレーンテキスト
コレクション : 国立国会図書館デジタルコレクション > デジタル化資料 > 雑誌
Journal
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- Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP
-
Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP 45 (3B), 2386-2389, 2006-03
Tokyo : Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physics
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Keywords
Details 詳細情報について
-
- CRID
- 1520853833589427200
-
- NII Article ID
- 40007204871
-
- NII Book ID
- AA10457675
-
- ISSN
- 00214922
- 13474065
-
- NDL BIB ID
- 7869312
-
- Text Lang
- en
-
- NDL Source Classification
-
- ZM35(科学技術--物理学)
-
- Data Source
-
- NDL Search
- Crossref
- CiNii Articles
