著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Tomohiko Yamakami and Shinichiro Suzuki and Mitsunori Henmi,Effects of interface nitride layer on electrical characteristics of SiO2/nitride/SiC metal-insulator-semiconductor diode,Japanese journal of applied physics : JJAP,00214922,Tokyo : The Japan Society of Applied Physics,2011-01,50,1,,https://cir.nii.ac.jp/crid/1520853833964265216,