Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Gian MAYUGA and Yuta YAMATO and Yasuo SATO and Michiko INOUE,High Reliable Memory Architecture with Adaptive Combination of Aging-Aware In-Field Self-Repair and ECC,電子情報通信学会技術研究報告 = IEICE technical report : 信学技報,09135685,東京 : 電子情報通信学会,2016-12-16,116,373,1-6,https://cir.nii.ac.jp/crid/1520853834047789952,