著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Taizoh Sadoh and Hiroki Ohta and Masanobu Miyao,Effects of Si layer thickness on solid-phase crystallization of stacked Ge/Si/SiO2 structures,Japanese journal of applied physics : JJAP,00214922,Tokyo : The Japan Society of Applied Physics,2009-03,48,3,,https://cir.nii.ac.jp/crid/1520853834256382464,