{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1521136281182188416.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"NDL_BIB_ID","@value":"023535077"}},{"identifier":{"@type":"URI","@value":"http://id.ndl.go.jp/bib/023535077"}},{"identifier":{"@type":"URI","@value":"https://ndlsearch.ndl.go.jp/books/R000000004-I023535077"}},{"identifier":{"@type":"URI","@value":"https://dl.ndl.go.jp/pid/11810817"}},{"identifier":{"@type":"NAID","@value":"40019205267"}}],"dc:title":[{"@value":"赤外線法による内部欠陥測定に関する研究"},{"@language":"ja-Kana","@value":"セキガイセンホウ ニ ヨル ナイブ ケッカン ソクテイ ニ カンスル ケンキュウ"}],"dcterms:alternative":[{"@value":"赤外線法による内部欠陥測定に関する研究"},{"@value":"Study on Measurement of Internal Defects by Infrared Thermography"},{"@value":"自動車関連技術特集号"},{"@language":"ja-Kana","@value":"ジドウシャ カンレン ギジュツ トクシュウゴウ"}],"dc:language":"ja","description":[{"notation":[{"@value":"コレクション : 国立国会図書館デジタルコレクション > 電子書籍・電子雑誌 > その他"}]}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1581980461347071874","@type":"Researcher","personIdentifier":[{"@type":"NRID","@value":"9000018919095"}],"foaf:name":[{"@value":"臂 安彦"}]},{"@id":"https://cir.nii.ac.jp/crid/1581980079410210048","@type":"Researcher","personIdentifier":[{"@type":"NRID","@value":"9000017265310"}],"foaf:name":[{"@value":"貴治 雅博"}]},{"@id":"https://cir.nii.ac.jp/crid/1581980461347071872","@type":"Researcher","personIdentifier":[{"@type":"NRID","@value":"9000017265312"}],"foaf:name":[{"@value":"山田 和明"}]}],"publication":{"publicationIdentifier":[{"@type":"NDL_BIB_ID","@value":"000008229949"},{"@type":"ISSN","@value":"18814085"},{"@type":"LISSN","@value":"18814085"},{"@type":"NCID","@value":"AA1214466X"}],"prism:publicationName":[{"@value":"JTEKT engineering journal / 編集委員会 編"}],"dc:publisher":[{"@value":"橿原 : ジェイテクト研究開発センター"}],"prism:publicationDate":"2011-12","prism:number":"1009","prism:startingPage":"96","prism:endingPage":"99"},"url":[{"@id":"http://id.ndl.go.jp/bib/023535077"},{"@id":"https://ndlsearch.ndl.go.jp/books/R000000004-I023535077"},{"@id":"https://dl.ndl.go.jp/pid/11810817"}],"foaf:topic":[{"@id":"https://cir.nii.ac.jp/all?q=internal%20defect","dc:title":"internal defect"},{"@id":"https://cir.nii.ac.jp/all?q=nondestructive%20test","dc:title":"nondestructive test"},{"@id":"https://cir.nii.ac.jp/all?q=infrared%20ray","dc:title":"infrared ray"},{"@id":"https://cir.nii.ac.jp/all?q=optical%20excited%20thermography","dc:title":"optical excited thermography"}],"dataSourceIdentifier":[{"@type":"NDL_SEARCH","@value":"oai:ndlsearch.ndl.go.jp:R000000004-I023535077"},{"@type":"CIA","@value":"40019205267"}]}