著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
A.I. Kirkland and W.O. Saxton and G. Chand,Multiple beam tilt microscopy for super resolved imaging,Journal of electron microscopy,00220744,Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press,1997,46,1,11-22,https://cir.nii.ac.jp/crid/1521417755905104000,