Sputtering, cluster primary ions and static SIMS: invited
Bibliographic Information
- Other Title
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- Sputtering cluster primary ions and static SIMS invited
- Proceedings of PSA-07 (International Symposium on Practical Surface Analysis) November 25-28, 2007, Kanazawa, Japan
- Proceedings of PSA 07 International Symposium on Practical Surface Analysis November 25 28 2007 Kanazawa Japan
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Journal
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- Journal of surface analysis / 表面分析研究会 編
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Journal of surface analysis / 表面分析研究会 編 14 (4), 305-311, 2008-10
東京 : 表面分析研究会
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Details 詳細情報について
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- CRID
- 1521980704912737024
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- NII Article ID
- 40016344402
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- NII Book ID
- AA11448771
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- ISSN
- 13411756
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- NDL BIB ID
- 9712945
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- Text Lang
- en
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- NDL Source Classification
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- ZM35(科学技術--物理学)
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- Data Source
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- NDL
- CiNii Articles