著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Naoki Yamamoto and Akio Toda and Katsuhiro Araya,Imaging of Transition Radiation from Thin Films on a Silicon Substrate Using a Light Detection System Combined with TEM,Journal of electron microscopy,00220744,Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press,1996,45,1,64-72,https://cir.nii.ac.jp/crid/1522262180437016448,