著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
H. Saka and S. Abe,FIB/HVEM observation of the configuration of cracks and the defect structure near the cracks in Si,Journal of electron microscopy,00220744,Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press,1997,46,1,45-57,https://cir.nii.ac.jp/crid/1522543653357972992,