Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Tamura Hifumi,New method of detecting secondary electrons on scanning electron microscope,電子顕微鏡学会誌,00220744,東京 : 日本電子顕微鏡学会,1968-07,17,2,106-111,https://cir.nii.ac.jp/crid/1522543654874232320,