Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Daisuke Kobayashi and Yuichi Yamamoto and Tsuguhide Isemura,SIMS proceedings paper : Time-of-flight SIMS depth profiling of Na in SiO₂ glass using C₆₀ sputter ion beam,"Research report of Asahi Glass Co., Ltd. = 旭硝子研究報告",00044210,横浜 : 旭硝子中央研究所,2013,63,,33-36,https://cir.nii.ac.jp/crid/1523106604935921024,