著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
O.I. Lebedev and G. Van Tendeloo and A.A. Suvorova,HREM study of ion implantation in 6H-SiC at high temperatures,Journal of electron microscopy,00220744,Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press,1997-08,46,4,271-279,https://cir.nii.ac.jp/crid/1523106604979777024,