Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Hiroaki Hanafusa and Nobumitsu Hirose and Akifumi Kasamatsu,Strain distribution analysis of sputter-formed strained Si by tip-enhanced Raman spectroscopy,Applied physics express : APEX,18820778,Tokyo : Japan Society of Applied Physics,2011-02,4,2,025701,https://cir.nii.ac.jp/crid/1523106605306951552,https://doi.org/10.1143/apex.4.025701