著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Kazuo Yamada and Kenji Nomura and Katsumi Abe,Examination of the ambient effects on the stability of amorphous indium-gallium-zinc oxide thin film transistors using a laser-glass-sealing technology,"Research report of Asahi Glass Co., Ltd. = 旭硝子研究報告",00044210,横浜 : 旭硝子中央研究所,2015,65,,127-130,https://cir.nii.ac.jp/crid/1523669555277599360,