著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
D. Cherns and A. Hovsepian and W. Jager,Profiling Ge islands in Si by large angle convergent beam electron diffraction,Journal of electron microscopy,00220744,Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press,1998-06,47,3,211-215,https://cir.nii.ac.jp/crid/1523669555573803008,