Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Ito Shinya and Noguchi Ko and Horiuchi Tadahiko and Okumura Koichiro,Electromigration test under high frequency pulsed current using on- chip pulse generator,Technical report of IEICE. SDM,,"The Institute of Electronics, Information and Communication Engineers",1994-07-25,94,180,67-72,https://cir.nii.ac.jp/crid/1570009752531169536,