Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
UENO S.,Statistical Monte Carlo simulations for dielectric breakdown of oxide thin films: Effect non-uniformity of electron trap generation,Proc. 1999 Int. Conf. on Simulations of Semiconductor Processing and Devices,,,,,,119-122,https://cir.nii.ac.jp/crid/1570291226446608256,