著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
KAWANAKA Shigeru and ONGA Shinji and OKADA Takako and OOSE Michihiro and IINUMA Toshihiko and SHINO Tomoaki and YAMADA Takashi and YOSHIMI Makoto and WATANABE Shigeyoshi,Study of LOCOS-Induced Anomalous Leakage Current in Thin Film SOI MOSFET's,IEICE transactions on electronics,09168524,一般社団法人電子情報通信学会,1999-07-25,82,7,1341-1346,https://cir.nii.ac.jp/crid/1570291227388399616,