Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
INOUE Takashi and CONTRATA Walter and OHATA Keiichi,A Simple Determination Method for the Source and Drain Resistances in the Ultra-Short Schottky-Gate FETs,IEICE technical report. Microwaves,,"The Institute of Electronics, Information and Communication Engineers",1997-09-26,97,288,51-56,https://cir.nii.ac.jp/crid/1570291227453977344,