Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
ITAZAKI Noriyoshi,Built-In Self-Test for multiple CLB faults of a LUT Type FPGA,"Test Symposium, IEEE, ATS'98, Proceedings, Seventh Asian, Dec. 1998",,,1998,,,,https://cir.nii.ac.jp/crid/1570572699935480064,