著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
HAMADA A.,Thermal coupling in integrated circuits : Application to thermal testing,IEEE J. Solid-State Circuits,,,2001,36,1,81-91,https://cir.nii.ac.jp/crid/1570572700084898816,