著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
HIRANO I.,Influences of initial bulk traps on Negative Bias Temperature Instability of HfSiON,"Proceedings of International Conference on Solid State Device and Materials, 2005",,,2005,,,,https://cir.nii.ac.jp/crid/1570572700428297472,