著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
YONEDA Tomokazu,Area and time co-optimization for system-on-a-chip based on consecutive testability,"IEEE International Test Conference 2003 (ITC'03), Sep.",,,2003,,,,https://cir.nii.ac.jp/crid/1570854175227542016,