著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
MATSUURA H.,Determination methods of densities and energy levels of impurities and defects affecting majority-carrier concentration in next-generation semiconductors,Advances in Condensed Matter and Materials Research,,Nova Science,2011,10,,chap.7,https://cir.nii.ac.jp/crid/1570854176182317440,